Structural and electronic properties of Bi-stabilized (2x1) reconstruction on the InP(100) surface
Laukkanen, Pekka1; Ahola-Tuomi, Marja1; Adell, Johan2; Adell, Martin2; Schulte, Karina3; Kuzmin, Mikhail1; Pakarinen, Janne1; Tukiainen, Antti1; Perälä, Riitta1; Väyrynen, Juhani1; Pessa, Markus1
1Finland;
2Sweden;
3United Kingdom

Bismuth (Bi) is a surfactant which controls electronic and structural properties of epitaxially grown III-V compound semiconductors [1], which are important materials for electronics. These changes in the III-V properties, which are caused by the presence of surfactant atoms on the growth front, have been attributed to the surfactant-induced reconstruction transition of the growing surface [2,3]. Thus, the understanding of Bi-stabilized reconstructions of III-V(100) surfaces is essential. Also, studies of the Bi/III-V(100) surfaces are important for the growth of III-V’s alloyed with Bi (e.g. GaAsBi), which are potential materials for spintronics [4].
We have recently found that on the InP(100) surface, Bi forms an interesting (2x1) reconstruction [5], which should be a metallic surface and therefore unstable according to the theory. We have studied the electronic and structural properties of this unusual (2x1) reconstruction by scanning tunneling microscopy and spectroscopy, and synchrotron-radiation core-level photoelectron spectroscopy. The presented results elucidate the atomic structure of the Bi/InP(100)(2x1) surface.
[1] S. W. Jun, C. M. Fetzer, R. T. Lee, J. K. Shurtleff, and G. B. Stringfellow, Appl. Phys. Lett. 76 (2000) 2716.
[2] J. K. Shurtleff, R. T. Lee, C. M. Fetzer, and G. B. Stringfellow, Appl. Phys. Lett. 75 (1999) 1914.
[3] C. M. Fetzer, R. T. Lee, J. K. Shurtleff, G. B. Stringfellow, S. M. Lee, and T. Y. Seong, Appl. Phys. Lett. 76 (2000) 1440.
[4] B. Fluegel, S. Francoeur, A. Mascarenhas, S. Tixier, E. C. Young, and T. Tiedje, Phys. Rev. Lett. 97 (2006) 067205.
[5] P. Laukkanen, J. Pakarinen, M. Ahola-Tuomi, M. Kuzmin, R. E. Perälä, I. J. Väyrynen, A. Tukiainen, J. Konttinen, P. Tuomisto, and M. Pessa, Phys. Rev. B 74 (2006) 155302.
back